1. Failure analysis of integrated circuits :tools and techniques
پدیدآورنده : edited by Lawrence C. Wagner
کتابخانه: Library of Razi Metallurgical Research Center (Tehran)
موضوع : Failures ، Semiconductors,Testing ، Integrated circuits,Reliability ، Integrated circuits
رده :
TK
7871
.
852
.
F35
1999
2. Failure analysis of integrated circuits : tools and techniques
پدیدآورنده : edited by Lawrence C. Wagner
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Semiconductors - Failures , Integrated circuits - Testing , Integrated circuits - Reliability
رده :
TK
7871
.
852
.
F35
1999
3. Integrated circuit failure analysis: a guide to preparation techniques
پدیدآورنده : Beck, Friedrich
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Semiconductors- Failures,، Semiconductors_ Testing
رده :
TK
7871
.
852
.
B43
4. #Semiconductor device and failue analysis
پدیدآورنده : #Wai Kin Chim
کتابخانه: Central Library of Esfehan University of Technology (Esfahan)
موضوع : Semiconductors- Failures ،Semiconductors- Testing ،Semiconductors- Microscopy ،Photon emission
رده :
#
TK
،#.
C47
5. Semiconductor device and failure analysis using photon microscopy
پدیدآورنده : / by Wai Kin Chim
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors- Failures,Semiconductors- Testing,Semiconductors- Microscopy,Photon emission
رده :
TK7871
.
85
.
C47
2000
6. The role of microscopy in semiconductor failure analysis
پدیدآورنده : Richards, B. P.
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Semiconductors - Testing , Semiconductors - Failures , Microscopes
رده :
TK
7871
.
85
.
R464
